Photoluminescence Inspection Is Changing How Manufacturers Protect Yield In SiC And GaN Devices

<p>Detecting subsurface or crystalline defects that directly impact electrical behavior in wide-bandgap materials.</p> <p>The post <a href="https://semiengineering.com/photoluminescence-inspection-is-changing-how-manufacturers-protect-yield-in-sic-and-gan-devices/">Photoluminescence Inspection Is Ch